標題: IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture [打印本頁] 作者: michaldl 時間: 2009-5-15 04:04 PM 標題: IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture Sponsor % n5 U) `0 v( Y; m% X# _Test Technology Standards Committee of the IEEE Computer Society & o4 Z2 x }$ z. H4 Y5 M' xApproved 14 June 2001( T) M: e1 ?2 B6 O. l% O5 p& i- E
IEEE-SA Standards Board! T- y+ P9 o, _9 H# [
Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and $ Y" p0 R* T+ s" T8 X/ dsupport of assembled printed circuit boards is defined. The circuitry includes a standard interface G. h5 E0 h' s3 N$ o- |5 A- pthrough which instructions and test data are communicated. A set of test features is defined, ! `+ j/ p; u" b6 `5 _7 Sincluding a boundary-scan register, such that the component is able to respond to a minimum set5 E# s' D9 \6 G8 Y* o ]5 o
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language& B, L$ b# ^' s P+ ^
is defined that allows rigorous description of the component-specific aspects of such testability features. . w) m( I g' K, J$ p& Z1 b* T/ s$ C) P
Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language, 4 H" M% k$ e+ r1 y& l: uboundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards, 2 @4 T5 a2 i( k9 h- BTAP, test, test access port, VHDL, VHSIC Hardware Description Language$ ~& z/ z: p, k- i Z. ~
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