Time | 16. September. 2011 (Friday)-Taiwan | Speaker |
9:00-9:30 | Registration & Coffee |
9:30-9:40 | Opening | Daniel Chang |
9:40-10:00 | Topic SAR-1 | Current status and future direction of SAR & HAC measurement standards:& T: F+ ?; s7 c! v# x" _! v2 n' i
Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232 | Dr. Mark Douglas |
10:00-10:30 | Topic SAR-2 | The present SAR regulation & newest information in Japan | Dr. Nobuhiro Nakanishi |
10:30-10:50 | Coffee Break |
10:50:11:20 | Topic SAR-3 | TAF Proficiency Test Requirement, take SAR for example. | Roger Sheng |
11:20-11:40 | Topic SAR-4 | Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms | Prof. Niels Kuster |
11:40-12:00 | Topic SAR-5 | New advances in fast, reliable SAR measurement techniques | Dr. Mark Douglas |
12:00-12:20 | Topic SAR-6 | Obtaining high-precision dielectric material characterization of liquids and solids | Dr. Mark Douglas |
12:20-13:30 | Lunch & DAK Demo |
13:30-13:45 | Topic OTA-1 | Current status and future direction of CTIA 3.1 & 3GPP | Prof. Niels Kuster |
13:45-14:25 | Topic OTA-2 | PART I - CTIA OTA TEST SYSTEM
7 }% L7 u! c# @) ~ ZPART II - APLUSTECH PRODUCT
8 O, B! |9 a/ i1 Q$ ?PART III - MIMO ANTENNA TEST | Kyung-ki Min |
14:25-14:40 | Topic OTA-3 | Novel OTA Phantoms | Prof. Niels Kuster |
14:40-15:10 | Topic 4G-1 | NFC Testing Challenges) i/ |! _% _7 b- o9 X+ n
-' |1 f6 R$ n9 H: W
NFC Technology Main Features
0 s, X' g: X: H7 Z1 h- w! d* ?4 H-& K Z. g0 H) c% }; U
NFC Testing Challenges
% h0 ^% r l" a; |+ X-
$ w2 Z6 P; t, c& f gNFC Forum Compliance Activities
" p% U4 v5 B, {6 l-
$ A& i8 x0 V0 E2 x& mRIDER RFID HF Tester | Rafael Garcia Escobar |
15:10-15:30 | Coffee Break |
15:30-16:00 | Topic 4G-2 | LTE R&D Testing$ z, ^. Y* C$ w" k) N- Q
-: K1 C6 |' T( G
LTE Design Verification Testing, w: D; b$ N3 e0 U/ I" `: R# i
-
% A1 L5 Y4 q/ N: Q! J7 H4 ?5 }" hNeeded functionalities for R&D Testing; y3 O1 e- P; ]" M0 H
-
6 |2 V! R) [# tLTE Mobile Application Usage Cases
4 H* I7 q1 B6 E-' ~* R4 J1 e0 N0 {3 O3 W8 j
LTE RF Design Validation Tester | Rafael Garcia Escobar |
16:00-16:20 | Topic 4G-3 | SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems) | Prof. Niels Kuster |
16:20-16:40 | Topic HAC-1 | Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment | Dr. Fin Bomholt |
16:40-17:10 | Topic EMI/ESD-1 | Next generation of near-field probes and their applications in ESD, EMI, etc. | Prof. Niels Kuster |
17:10-17:30 | Q & A | Annie Yang |
17: 30-17:40 | Closing | Daniel Chang |