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標題: e-Manufacturing & DFM Symposium 4/1開放報名 [打印本頁]
作者: jiming    時間: 2007-3-27 02:57 PM
標題: e-Manufacturing & DFM Symposium 4/1開放報名
Keynote邀請到前清大校長劉炯朗擔任
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  　　This is the first e-Manufacturing symposium organized by Taiwan Semiconductor Industry Association (TSIA) aiming to forge stronger links between the Academia and the Industry on complementary and collaborative efforts in maintaining the national leading edge competitive advantages and capabililities among the world's manufacturing bases.
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　　The Symposium initiates to offer a common arena for academics and professionals of business operators, concept creators, product designers, commondity manufacturers, hardware suppliers, software vendors, independent consultants, network distributors and logistics controllers to exchange fundamental concerns, to discuss immediate outlooks and future trends, and to explore the uncharted territories altogether. 9 L" N6 w! E& E1 x8 z8 f, {2 T5 `
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作者: chip123    時間: 2008-2-18 11:22 AM
標題: Call for Papers Announcement
e-Manufacturing & DFM Symposium 2008 (AJoint Symposium with AEC/APC-Asia Symposium 2008) hosted by TSIA will be held on November 27-28, 2008 at Ambassador Hotel HsinChu. Please submit your abstract to symposia@tsia.org.tw.
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Topics of interests include, but not limited to, the following:+ _9 ]6 R7 A$ i0 g# D
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Applications in high-volume manufacturing3 A5 v/ k1 }/ u" S! v
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) J& I9 ~% B6 z! R! |Automated Material Handling System
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1 Z, Y5 D) \+ X9 q0 @- \( rBenefits and justification (ROI, CoO, OEE…)
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8 [7 ?8 b, Q9 J4 J+ q3 R( b1 nControl Architecture/Engineering/IT Infrastructure. E+ `; R1 Z% S* h" S4 Y" O
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Data Collection/Quality/Storage/Management6 c" G% q# d- d- k
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Design for Manufacturing/Testing/Yield" v- H* P* w9 y5 m
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e-Diagnostics, e-Manufacturing, and EEC
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Engineering/Supply/Value Chains  Q# c; Q1 h* G4 v
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; d8 l/ e0 K( {2 R- ?: iEquipment Communication/Integration$ N* _; u' w' e( V! P" ]
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Factory Integration/Operations8 R: x- ?( K7 D$ {0 |. R$ @
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8 l8 ]# x' a6 N5 k6 }" lFactory-Wide Applications and Deployment
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  M' I  K! C- N3 lFault Detection & Classification5 J; H% d; G0 R0 {8 N
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3 g8 q4 Y0 x( ?4 a' uFuture APC/FDC Needs and Requirements& m; P! h2 s+ O% L2 B' B7 F
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0 \5 ]/ N: p5 P4 C6 ~( N" DIntegrated/Virtual Metrology% B. i- m/ V/ m: z: _4 \2 x
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3 X5 D1 A2 l& h- C0 _Manufacturing Execution Systems
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7 [( ~+ O/ o1 p6 _1 XReal-Time & Defect/Yield Databases0 y0 x: e* t5 a$ f# D: Q
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9 q8 u* S5 I1 i% w* KPiggyback and SCADA controllers
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3 T: q; Z, d1 k3 ?" }/ {' L" r9 CPredictive/Preventive Maintenance
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: C- S3 l( {3 O+ K  Y4 z( `Process modeling and model-based control8 Z; @5 Z# Y% P2 k1 G0 W' i& C
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Real-time data collection and management
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Real-Time Decision-Making3 g0 r9 S+ X3 J. E* M& i8 J
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  X- J; |: p# \8 j; ORun-to-Run/Wafer-to-Wafer/Real-Time Control
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' Q( m& w, j4 i9 _1 H' @Scheduling & Dispatching
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8 L$ {) O& P( R! ], h* mSensor development and implementation
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( `$ f  ]8 G+ v: v4 ?8 vSensor integration into existing process tools
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Sensor/actuator bus and intelligent sensors
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Specification Management5 d, w& Z7 S# U) ?, D
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8 x' x- j* b& `5 d" V# M# X- P  W; vStandards (Communication, Sensor Bus…)
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Tool Productivity Data Collection/Analysis# x. j5 t* V" ]* B& W; H2 @
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WIP Management5 u1 L. g/ L9 R* i' y7 D# G
Please consider the following important dates: 5 M0 A) t; o- D2 a
            Deadline of abstract submission : July 1, 2008
% G4 X' P3 i) }( Y: K- ]            Notification of accetpance : August 22, 2008
7 H" `5 X7 P1 _- J! i. H2 C            Final paper due : October 20, 2008
5 ~7 K' L! j9 }' k/ }            Deadline of early registration : October 20, 2008
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9 q/ I- O3 Y  R3 v: c8 Q) l' kIf any question, please contact with Celia Shih  石英堂: h- A& D+ n) ?. ~" A; b
Taiwan Semiconductor Industry Association
9 x5 v( ^' `1 B! U! p& `台灣半導體產業協會
: f1 v* Q( b9 G1 m* l  R; ATel : +886-3-5917092; X; _1 A; z+ g) ]' ^
Fax: +886-3-5820056



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