Time | Title |
13:00 ~ 13:20 | 7 E" [( q+ b0 F% _9 w3 a7 g; j- z4 M
Registration% I9 X" [% o' t0 ?. E
報到 |
13:20 ~ 13:30 | 8 O" N; J4 O$ d% z' \+ A5 d
Opening
6 N. f: r: R6 |( }; `+ h: O; V6 [開場 |
13:30 ~ 14:00 | ( q g2 y5 J5 D) i
PXI Interoperability
2 F# J c& [. |4 f2 \6 IPXI 模組互通性之探究 |
14:00 ~ 14:50 | % d/ \+ c2 q, t3 i/ T; n1 ]
Fundamentals of High-Speed Digitizers
' W, |* s2 M+ ^9 X$ {6 O高速數位轉換器理論基礎與應用 |
14:50 ~ 15:10 |
+ w; @9 ^5 y* _# A, r: P# QTea Break4 p( G1 A- S6 a. ?/ G% z d
中場休息 |
15:10 ~ 15:40 |
3 p: I0 L: A# WFundamentals of High-Speed data Throughput in PXI
( T- w r7 I4 R+ w1 N- y) j# }PXI 系統高速資料傳輸之剖析 |
15:40 ~ 16:30 | " w) m7 Y; o& n
Electronic functional test best practices - Methods to achieve accurate, reliable measurements in electronic functional test applications
& J8 _+ E) y: o. s7 {3 V- p8 t- j電子功能性測試最佳實務:實現準確、可靠的電子功能性測試應用 |