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speaker: Mr. Wilhelm Radermacher, Senior Director, Mixed Signal & RF Solutions, Semiconductor Test, Verigy 38p: _8 t: M& P! o6 Z/ ?6 Q
7 y s. q# ^8 Y; @2 AThe Semiconductor Cycle of Innovation
0 A: \: T9 ^8 v& N3 |( A* W* gTSV = Extreme Version of 3D Stacking5 T- Q' E! f" q+ |+ i$ _$ l7 y5 Z
7 e, ?, W% S6 P: N• Applications. Y7 X+ a6 b+ I! G4 @; N
• Test challenges
8 O9 Q! i! X4 @• Proposed test flow3 ~* v; B/ e5 D! G
• ATE
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