IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture

michaldl

Sponsor
Test Technology Standards Committee of the IEEE Computer Society
, s% M; @0 {  s$ u1 c" }; @Approved 14 June 2001
IEEE-SA Standards Board
Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
: s3 |+ u8 w+ m1 \7 Usupport of assembled printed circuit boards is defined. The circuitry includes a standard interface
through which instructions and test data are communicated. A set of test features is defined,
including a boundary-scan register, such that the component is able to respond to a minimum set
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language
is defined that allows rigorous description of the component-specific aspects of such testability features.

Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,
9 d( \5 r2 B/ d% ]- c1 o+ Rboundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,
5 k8 k/ [- D+ H; o8 TTAP, test, test access port, VHDL, VHSIC Hardware Description Language

/ K3 E5 f. t9 j$ h, Q/ W

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