IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture

michaldl

Sponsor
Test Technology Standards Committee of the IEEE Computer Society
Approved 14 June 2001
2 A9 w) D/ p3 f/ Q  @IEEE-SA Standards Board
Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
support of assembled printed circuit boards is defined. The circuitry includes a standard interface
4 o# H! X# }- P( ]- Mthrough which instructions and test data are communicated. A set of test features is defined,
7 ]+ i3 v" D* u( K; A& l8 X1 K" J9 `including a boundary-scan register, such that the component is able to respond to a minimum set
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language
is defined that allows rigorous description of the component-specific aspects of such testability features.

Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,
boundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,
TAP, test, test access port, VHDL, VHSIC Hardware Description Language
8 ?9 q2 @& Q6 c

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