IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture

michaldl

Sponsor
  I' k% }: z; [6 q/ v5 U' d" D) J9 PTest Technology Standards Committee of the IEEE Computer Society
Approved 14 June 2001
( \- d& L/ v& O5 A1 ?IEEE-SA Standards Board
Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
8 c5 a' s5 }9 `1 l5 g" a; I* qsupport of assembled printed circuit boards is defined. The circuitry includes a standard interface
through which instructions and test data are communicated. A set of test features is defined,
including a boundary-scan register, such that the component is able to respond to a minimum set
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language
. u& q1 j& W) |& G+ ^0 s9 W5 B; o! l: qis defined that allows rigorous description of the component-specific aspects of such testability features.
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Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,
: q  v1 r  d0 hboundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,
7 }% `$ E/ L+ hTAP, test, test access port, VHDL, VHSIC Hardware Description Language
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